Compact Temperature Controlled Probe Station for Research and Development
解决方案概述
Expand Your Keysight Electrical Analysis System With a Controlled Test Environment and Optical Instrument Compatibility
Temperature and atmospheric effects can cause dramatic changes in electrical system characteristics and performance. Characterizing these environmental effects is a crucial step in advancing academic research and product development. Furthermore, spectrometer and microscope measurements may be performed alongside electrical testing to fully characterize a device, which requires a very small form factor and optical access from both sides.
Typically, this requires extensive test preparation and planning, which is both slow and costly. Purpose-built environmental control solutions are available but can be extremely expensive and often impractically large for smaller work areas or laboratories. Their size also makes integration with scopes and spectrometers nearly impossible, limiting the range of experiments that they can be used to conduct