应用文章
Interconnect Components for High-Speed Digital Applications
As bit rates of digital systems increase, the signal integrity of interconnects drastically affects system performance. Fast and accurate analysis of interconnect performance in both time and frequency domains becomes critical to ensure reliable system performance. As managing multiple test systems becomes difficult, a single test system that can fully characterize differential high-speed digital devices is a very powerful tool.
Measurement Parameters
Let’s take a look at measurement parameters. Traditionally, the engineer makes measurements by using a vector network analyzer (VNA) and time domain reflectometer (TDR) oscilloscope. But pairing TDR software with the VNA lets you measure frequency and time domain parameters with a single instrument.
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