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S-Parameter Measurements on Multiport Devices
Reduce the time to measure the S-parameters of your high pin count multiport devices
The MPTS 388 automated test system from In-Phase Technologies utilizes a high pin count switching matrix to automatically configure S-parameter measurements for devices with up to 216 ports. When matched with a Keysight Technologies vector network analyzer the In-Phase MPTS 388 test system allows you to reduce dramatically the time to measure the S-parameters of your high pin count multiport microwave devices.
- S-parameter measurements on high pin count multiport devices
- Switching matrix allows automatic reconfiguration of connections
- Test system handles high pin count devices with up to 216 ports
- Works with Keysight PNA or PNA-X microwave network analyzer
- Proprietary software for automated control
- Software allows user-defined naming conventions
- Reduces time to measure S-parameters on multiport devices
- Request more information and Keysight’s partner, In-Phase, will contact you to discuss your requirements in more detail.