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Keysight E5270A Sample Program for High Speed L-I-V Test
The L-I-V test is fundamental to production tests of laser diodes. The high speed and precision measurement performance of the E5270 Series Parametric Measurement Solutions promises improvement to the total throughput of production tests and reduced production costs.
This sample program is optimized for the high speed L-I-V test, and it is written in HT-BASIC for Windows. To execute this sample program, the PC environment with HT-BASIC and GPIB interface is required.
For more details, refer to the document included in the zip archive file.