| K8204G | i3070 UnMux System Testhead, GTE 11.00p | |
| K8209G | License To Use 20Mps, GTE 11.00p | |
| K8202G | i3070 UnMux Test Development, GTE 11.00p | |
| K8259G | High Node Count Development Feature, GTE 11.00p | |
| K8248G | i3070 12MPs Single License To Use, GTE 11.00p | |
| K8269G | Offline to Inline Conversion Feature, GTE 11.00p | |
| KS6181A | Industry 4.0 Acceleration Bundle for 2-mod ICT system (Workcell) | |
| K8247G | i3070 UnMux Test Development, Single License - version 11.00p | |
| K8258G | High Node Count Test Feature, GTE 11.00p | |
| KS6180A | Industry 4.0 Acceleration Bundle for 2-mod ICT system (Enterprise) | |
| K8268G | Low current measurement Feature, GTE 11.00p | |
| M6801B | x1149 Runtime Software License | |
| K8203G | i3070 Mux System Testhead, GTE 11.00p | |
| K8205G | Inline Mux System Testhead, GTE 11.00p | |
| K8206G | Inline Mux System Testhead, GTE 11.00p | |
| K8207G | License To Use 6MPs , GTE 11.00p | |
| K8208G | License To Use 12MPs, GTE 11.00p | |
| K8210G | Timing Sets Feature, GTE 11.00p | |
| M6815B | x1149 Development Software License | |
| K8211G | K8211G, Diagnose Relays Feature, GTE 11.00p | |
| K8212G | Boundary Scan 1149.1 Feature, GTE 11.00p | |
| K8213G | Boundary Scan 1149.6 Feature, GTE 11.00p | |
| K8214G | Silicon Nails Feature Runtime only, GTE 11.00p | |
| K8215G | Advanced Throughput Multiplier Feature, GTE 11.00p | |
| K8216G | External Application DLL Feature, GTE 11.00p | |
| K8217G | Cover Extend Feature, GTE 11.00p | |
| K8218G | Drive Thru Feature, GTE 11.00p | |
| K8219G | Flash ISP Feature, GTE 11.00p | |
| K8220G | PLD ISP Feature, GTE 11.00p | |
| K8221G | Flash70 Feature, GTE 11.00p | |
| K8222G | NIST Calibration Feature, GTE 11.00p | |
| K8223G | DGN Advanced Reporting Feature, GTE 11.00p | |
| K8224G | Software Update For Test Development Feature, GTE 11.00p | |
| K8226G | Customized Datalog Converter, GTE 11.00p | |
| K8255G | Special One-time Software Update Kit, GTE 11.xxp | |
| K8265G | SuperCap Feature, GTE 11.00p | |
| K8233G | Software Update For Test Development Feature, GTE 11.00p | |
| K8256G | Software Update for Test Development Feature | |
| K8266G | LED Analyzer Integration Feature, GTE 11.00p | |
| K8235G | One-time Software Update Kit, Version 11.xxp | |
| K8257G | 3-Year Software Update For Test Development Feature, GTE 11.00p | |
| K8267G | Flash Programming Integration Feature, GTE 11.00p | |
| K8246G | i3070 Mux Test Development, Single License - version 11.00p | |
| K8228G | Silicon Nails Feature Development and Runtime, GTE 11.00p | |
| K8227G | Async Parallel Test Feature, GTE 11.00p | |
| K8251G | i3070 Standard SW Bundle, GTE 11.00p | |
| K8261G | GM CyberSecurity Global A, GTE 11.00p | |
| K8291G | FlexiCoreX plugins for additional instruments | |
| K8229G | i3070 In-Circuit Parallel Tester 2 Modules Activation License | |
| K8250G | i3070 Basic SW Bundle, GTE 11.00p | |
| K8263G | Quad Density Feature, GTE 11.00p | |
| K8253G | i3070 NIST Calibration and DGN Advanced Reporting SW Bundle Feature, GTE 11.00p | |
| K8264G | Enhanced Shorts Feature, GTE 11.00p | |
| K8254G | Software Update For Test Development Bundle Feature, GTE 11.00p | |
| K8201G | i3070 Mux Test Development, GTE 11.00p | |
| K8252G | i3070 Standard SW Bundle - FLX, GTE 11.00p | |
| K8262G | i3070 Mux System Testhead, GTE 11.00p | |
| M6818B | x1149 Base license for 4x controller | |
| M6802B | x1149 IEEE1687 Development Feature License | |
| M6803B | x1149 IEEE1687 Run Time Feature License | |
