BER measurement: automatic re-synchronization, log file, view actual and accumulated BER and errors of 1s, 02, and total transferred at a glance
Fast Eye Mask measurement: Provide fast pass/fail testing for manufacturing test
Output Timing measurement: Provide results for setup & hold times, skew between channels, Jitter (RJ/DJ/TJ) and phase margin
Spectral decomposition of Jitter components: Allows inband and outband characterization of circuits and devices including PLLs and CDRs. While debugging designs, the new measurement allows the exploration of the various components of deterministic jitter.
Output Level measurement: Provide results for high/low levels, amplitudes, threshold margins and Q-factor analysis
Eye Opening measurement: Provide results for eye openings and optimum sample points
