segmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300embasegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/mofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/hd/hd304mso,keysight:models/hd/hd300emba
How to Debug Electronic Devices with High Accuracy
要实现高质量的消费电子产品性能,需要调试微小信号、隔离罕见故障,并分析串行总线。新技术的兴起,如依赖高速网络、低噪声和低功耗的便携式消费电子设备,使工程师面临识别可能影响性能的细微问题的挑战。
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