Scaling 1.6T production with high-throughput optical testing
Optimizing 1.6T optical transceiver manufacturing tests requires a reliable and accurate setup to fine-tune and detect defective devices. To meet AI data center demand, production tests must quickly ramp production while maintaining high test yield, speed, and efficiency for high throughput and lower costs. Optical sampling oscilloscopes characterize transmitter performance, measuring transmitter dispersion and eye closure quaternary (TDECQ) performance to determine pass / fail compliance.
Accurate TDECQ measurements across eight 224 Gb/s optical lanes and temperature ranges require a high-bandwidth, high-sensitivity sampling oscilloscope, optical switching, and test automation. Engineers may also fine-tune laser bias, modulator voltage, and other settings to optimize performance. During tuning and temperature ramp stages, the oscilloscope may sit idle, making it crucial to measure multiple device lanes at once to minimize downtime and maximize throughput for high-yield production scaling.
1.6T optical transceiver manufacturing test solution
Scaling 1.6T optical transceiver production requires fast, efficient TDECQ measurements with an optical oscilloscope without sacrificing accuracy or reliability. The Keysight 1.6T optical transceiver manufacturing test solution uses FlexOTO optical test optimization software, an optical switch, and high-bandwidth, low noise DCA-M optical sampling oscilloscopes to maximize device utilization. Validation engineers can design test programs to acquire and analyze data from multiple 224 Gb/s PAM4 optical lanes in parallel, reducing idle times, increasing throughput, and ensuring precise measurement accuracy and pass / fail assessment to improve device yield.
How to Optimize 1.6T Optical Transceiver Manufacturing Tests
N7731C Two Channel 1x4 Optical Switch
The N7731C offers two independent 1x4 optical switches, ideal to connect up to four devices to a test setup, or to share up to four measurement instruments with the same device under test.