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演示
本视频概括介绍了是德科技的自动化 100G 光接收机极限测试解决方案 N4917B。了解 Keysight N4917B 解决方案何以能够帮助您显著加速 100G 以太网的 LR4、ER4 和 SR4 光接收机一致性测试。
2016-11-30
其他资源
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications
2015-03-24
其他资源
J-BERT offers adjustable and integrated inter-symbol interference
2015-01-22
其他资源
Achieve accurate receiver characterization with the J-BERT high-performance BERT
2014-07-09
再版文章
For design, test and validation engineers who need to characterize and validate compliance of their MIPI designs.
2013-11-15
演示
This video demonstrates the value of a pattern generator with integrated 5-tap de-emphasis when dealing with cable, connector, PCB board material, and other losses. With de-emphasis, the frequency-dependent loss can be compensated for and the test equipment can deliver a clean open eye to the DUT
2013-07-18
演示
Manufacturing and optical 10G transceiver test with the Keysight N4962A serial BERT 12.5 Gb/s
2013-04-19
演示
Reduce crosstalk testing time and uncover hidden problems with delay sweep and the Keysight N4965A
2013-04-19
其他资源
JBISTGUI utilizes the two channel mode of J-BERT N4903B and configures transmission of the necessary pattern sequences that can enable the BIST-L and BIST-TAS test modes for SATA host and device products. This Software simplifies Keysight’s receiver test setup by eliminating the need to switch...
2013-03-18
研讨会材料
This Keysight Education Forum presentation explores the journey to PCIe® 7.0, addressing the advanced testing challenges of 32 Gbaud PAM4 and uncovering solutions that shape the future of high-speed data transmission.
2025-01-29
用户手册
Keysight M809212CA Receiver Conformance Test Application for OIF-CEI 5.0 (112G) User Guide
2024-07-10
用户手册
Keysight N5991MD MIPI D-PHY Test Automation Software Platform User Guide
2024-03-15
技术资料
The M8020A BERT is a AXIe based Bit Error Ratio Test Solution for PCIe, USB, Thunderbolt and many more industry standards.
2022-09-20
技术资料
An efficient test strategy is a proven competitive advantage. Keysight's N5990A Test Automation Software Platform is a key element of winning strategies.
2021-06-02
技术资料
This is a data sheet discussing the Keysight Technologies J-BERT N4903B High-Performance Serial BERT.
2019-11-29
技术资料
The 81495A is a OE converter module for the 816x lightwave measurement system. It is optimized for the N4917 optical stress test solustion and works perfect as frontend for oscillocopes.
2019-10-02
快速入门指南
The getting started guide helps you identify the contents of the shipping package, perform a quick functional check of the product, and guide you on where to find more information and support for the N4960A.
2019-04-01
用户手册
The user's manual covers: setting up the system, operation, applications, performance specifications, remote operation, and warranty/product service.
2019-04-01
技术资料
The 86100D provides high performance with low intrinsic jitter while supporting Keysight's latest sampling scope plug-in modules along with many of the older legacy plug-in modules.
2019-01-15
技术资料
Update on ordering information on each page and a title change. Also remove AXIe, LXI and PXI standards.
2018-03-26
手册
The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.
2018-03-08
技术资料
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.
2018-02-13
技术资料
N4917A optical receiver stress test solution allows repeatable and accurate optical stress for receiver tolerance test of 10GbE 802.3ae -LR, -ER -SR and 10G FC transceivers.
2017-12-02
技术资料
Keysight’s 81490A Reference Transmitter is designed to offer excellent eye quality as a reference for testing 10GbE -LR/ -ER, 10G Fibre Channel 10GBase-SR, 40GBase-SR4, and 100GBase-SR10.
2017-12-02
技术资料
The N4967A Serial BERT System operates at 40 Gb/s for device characterization, research and development testing, production testing, and general lab use.
2017-12-02